Proceeding Details
| Title : TheIIER INTERNATIONAL CONFERENCE |
| Conference Place & Date: Zurich, Switzerland 16-08-2023 |
TheIIER INTERNATIONAL CONFERENCE
| ANALYZING ESD RELIABILITY STRENGTHENING OF 40-V NLDMOS WITH DRAIN-SIDE PARASITIC SCRS | |||||||||||
| Page(s): | 39-44 | ||||||||||
| Author | SHEN-LI CHEN, WEI-JUNG CHEN, CHIH-YING YEN | ||||||||||
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