Title : iFeARP World INTERNATIONAL CONFERENCE |
Conference Place & Date: Osaka, Japan 16-08-2023 |
COMPREHENSIVE CHARACTERIZATION OF TiO2/GaN/AlGaN/GaN METAL-OXIDE-SEMICONDUCTOR HIGH-ELECTRON MOBILITY TRANSISTORS | |||||||||||
Page(s): | 39 | ||||||||||
Author | YU-SHYAN LIN, CHI-CHE LU | ||||||||||
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