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Proceeding Details

Title :
THE IRES INTERNATIONAL CONFERENCE
Conference Place & Date:
Bali, Indonesia 13-10-2017
THE IRES INTERNATIONAL CONFERENCE

Creep-Fatigue Damage Evaluation Using Interrupt Creep Test
Page(s): 1-4  
Author Jeong Hwan Kim, Uijeong Ro, Hoomin Lee, Seok Jun Kang, Moon Ki Kim  
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WRL Cited By- 144
 

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