Paper Title
C60 THIN FILM DEPOSITION BY SPIN COATING AND ULTRASONIC TECHNICS

Abstract
Fullerene (C60) thin films have been deposited in harsh environment on glass substrates, using Benzene and Toluene as initial test by spin coating, and secondly, the 2-methoxyethanol was mixed with toluene as a solvent to C60 and deposed by ultrasonic technic. From the first test, Toluene solvent outfits more the C60 than the Benzene as carbon concentration is higher, the films are thicker and nanorods are observed. While, from test two, the samples show better crystallinity of C60. Furthermore, deposited thin films were investigated using X-ray diffraction (XRD), atomic force microscopy (AFM), infrared and Ultraviolet-Visible spectroscopy (IR, UV-Vis), Scanning electron microscopy (SEM) and energy dispersive x-ray spectroscopy (EDS). Keywords - Fullerene (C60), Organic semiconductor, ultrasonic, Crystallinity, Toluene solvent.