Paper Title
Frequency Response Functions of Rectangular Atomic Force Microscope Cantilevers in Contact and Noncontact Modes

Abstract
In this study, the amplitude of FRF for a rectangular AFM cantilever studied. For improving the model, the most details have been supposed. In the methodical model, the angle between cantilever and sample surface, lateral and normal contact stiffness and tip height have been considered. The beam has been analyzed using Euler-Bernoulli beam theory. Results show that by rising the beam length and width, the resonant frequency and amplitude of FRF reduces. Absence of tip-sample interaction force, rises the resonant frequency. Keywords - Atomic Force Microscope, Contact Mode, Euler-Bernoulli Beam Theory, Resonant Frequency