Paper Title
The Computational Simulation of FICBE Test Bench Using Transient Analysis Technique

Abstract
This works reports the computational simulation of the FICBE test bench the transient analysis technique. The discharge probe and its stray impedance had been simulated using RLC circuit analyzed in transient mode. The simulation revealed that the stray impedance could distort FICBE discharge current, which is very high peak current, fast rise time waveform, and lead the non-compliant in test bench qualification. In addition, the adding of ferrite bead could shape the discharge current to meet the standard waveform requirement. These findings is beneficial to the FICBE test bench design guideline to meet the waveform qualification accurately. Keywords - Field-Induced, Charged Board Model, Charged Board Event, Circuit Simulation