Paper Title
Effect of Substrate Surface on Structural Properties of Cobalt-Chromium Thin Films

Abstract
In recent years, Cobalt-chromium thin films media have shown useful properties for high-density perpendicular magnetic recording. In this work CoxCr1-x thin films are deposited on Si(100) and Corning glass substrates, at room temperature using thermal evaporation under vacuum system, under the same conditions. The thickness measurements and atomic composition of the samples were performed by Rutherford backscattering spectrometry (RBS) technique using SIMNRA programme. The thickness of the magnetic layer ranged from 17 to 220 nm, and the content chromium, from 0.12 to 0.20. DRX measurements of CoxCr1-x / Si(100) infer that all the samples were polycrystalline, with an hcp structure and show a <0001> preferred Orientation. However the x-ray diffraction patterns of CoxCr1-x /glass are very noisy, the reflections being weak and very broad. Atomic force microscopy (A.F.M.) observations reveal very smooth film surfaces. Keywords - CoCr System; Thin Films P.A.C.S.: 81.30.Dz; 75.70.-i